关键词: 局部二值模式, 图像分割, 疵点检测, 工业检测, 织物

Abstract: To describe different texture structure accurately, an improved local binary patterns method was proposed. Corresponding main pattern sets for different texture structure were established by this method. Based on the proposed method, an effective threshold-based fabric defect detection algorithm was designed. Parameters were set up for patterned and unpatented fabric. Firstly the features of free defect image were extracted by Adaptive Local Binary Patterns(ALBP) and the defect judgement threshold was obtained. Then the image to be tested was divided into same size detection windows from which ALBP features were also extracted. The features were compared to the threshold to find the defective window. To obtain precise segmentation results, the parameters of patterned and unpatented fabric were discussed respectively.The experiments showed the detection effect of the proposed method was comparatively better than traditional local binary patterns from visual aspect and detection accuracy.

Key words: local binary patterns, image segmentation, defect detection, industrial detection, fabric